ASTM E 2481 : 2012 : R2023

1.1This test method provides a procedure to determine the ability of a photovoltaic (PV) module to endure the long-term effects of periodic “hot spot” heating associated with common fault conditions such as severely cracked or mismatched cells, single-point open circuit failures (for example, interconnect failures), partial (or nonuniform) shadowing, or soiling. Such effects typically include solder melting or deterioration of the encapsulation, but in severe cases could progress to combustion of the PV module and surrounding materials.

1.2There are two ways that cells can cause a hot spot problem: either by having a high resistance so that there is a large resistance in the circuit, or by having a low resistance area (shunt) such that there is a high current flow in a localized region. This test method selects cells of both types to be stressed.

1.3This test method does not establish pass or fail levels. The determination of acceptable or unacceptable results is beyond the scope of this test method.

1.4The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.5This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.

1.6This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.