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ASTM
ASTM F 612 : 1988

ASTM F 612 : 1988

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

Practice for Cleaning Surfaces of Polished Silicon Slices (Withdrawn 1993)

Withdrawn date

01-05-1996

Published date

31-12-2010

Publisher

American Society for Testing and Materials

CONTAINED IN VOL 10.05 1996 Describes technique for cleaning silicon slices. Produces slice surfaces that are free of visible particulate matter when viewed under bright illumination by unaided eye.

Committee
ASTM
DocumentType
Standard Practice
PublisherName
American Society for Testing and Materials
Status
Withdrawn

ASTM F 416 : 1994 Test Method for Detection of Oxidation Induced Defects in Polished Silicon Wafers (Withdrawn 1998)

FED-STD-209 Revision E:1992 AIRBORNE PARTICULATE CLEANLINESS CLASSES IN CLEANROOMS AND CLEAN ZONES
ASTM D 1125 : 2014 : REDLINE Standard Test Methods for Electrical Conductivity and Resistivity of Water (Withdrawn 2023)

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