ASTM F 72 : 2017

Name: ASTM F 72 : 2017
Brand: ASTM
Price: 135.86 AUD

Superseded

View Superseded by

Standard Specification for Gold Wire for Semiconductor Lead Bonding

Available format(s)

Hardcopy , PDF

Superseded date

03-06-2020

Language(s)

English

Published date

01-12-2017

Publisher

American Society for Testing and Materials

CONTAINED IN VOL. 10.04, 2018 Defines round drawn/extruded gold wire for internal semiconductor device electrical connections.

1.1This specification covers round drawn/extruded gold wire for internal semiconductor device electrical connections. Four classifications of wire are distinguished, (1) copper-modified wire, (2) beryllium-modified wire, (3) high-strength wire, and (4) special purpose wire.

Note 1:Trace metallic elements have a significant effect upon the mechanical properties and thermal stability of high-purity gold wire. It is customary in manufacturing to add controlled amounts of selected impurities to gold to modify or stabilize bonding wire properties, or both. This practice is known variously as “modifying,” “stabilizing,” or “doping.” The first two wire classifications denoted in this specification refer to wire made with either of two particular modifiers, copper or beryllium, in general use. In the third and fourth wire classifications, “high-strength” and “special purpose” wire, the identity of modifying additives is not restricted.

1.2The values stated in SI units shall be regarded as the standard.

1.2.1A mixed system of metric and inch-pound units is in widespread use for specifying semiconductor lead-bonding wire. SI-equivalent values of other commonly used units are denoted by parentheses in text and tables.

1.3The following hazard caveat pertains only to the test method portion, Section 9, of this specification. This standard does not purport to address all of the safety, health, and environmental concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

1.4This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

Committee	F 01
DocumentType	Standard
Pages	11
PublisherName	American Society for Testing and Materials
Status	Superseded
SupersededBy	ASTM F 72 : 2017 : EDT 1
Supersedes	ASTM F 72 : 2006

ASTM F 219 : 1996	Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps
ASTM E 16 : LATEST	METHOD OF FREE BEND TEST FOR DUCTILITY OF WELDS