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BS 9610:1982

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

Specification for quartz crystal units of assessed quality: generic data and methods of test

Available format(s)

Hardcopy , PDF

Withdrawn date

15-09-1999

Language(s)

English

Published date

29-10-1982

Foreword
Cooperating organizations
Specification
Section one. Principles and mandatory procedures
1.1 General matters
1.1.1 Scope
1.1.2 Related documents
1.1.3 Terminology
1.1.4 Letter symbols, signs and abbreviations
1.1.5 Graphical symbols
1.1.6 Marking of the component and package
1.1.6.1.1 Marking and identification code for quartz
           crystal units
1.1.7 Eligibility for qualification approval
1.1.8 Structurally similar components
1.1.8.1 Inspection of structurally similar components
1.1.9 Delayed delivery
1.1.10 Supplementary procedures for qualification
           approval (of thickness shear mode crystal
           units only)
1.1.11 Certified test records
1.1.12 Standard ratings and characteristics
1.1.12.1 Operating temperature ranges
1.1.12.2 Frequency tolerances
1.1.12.3 Circuit conditions
1.1.12.4 Levels of drive
1.1.12.5 Climatic category
1.1.12.6 Bump severity
1.1.12.7 Vibration severity
1.1.12.8 Shock severity
1.1.12.9 Leak rate
1.1.13 Procedure to be followed in the event of
           failures at group C or D inspection
1.1.14 Ordering information
1.1.15 Release prior to completion of group B tests
1.2 Test procedures
1.2.1 Test measurement conditions
1.2.2 Visual inspection
1.2.2.1 Visual test A
1.2.2.2 Visual test B
1.2.2.3 Visual test C
1.2.2.4 Visual test D
1.2.3 Dimensioning and gauging procedures
1.2.3.1 Dimensions test A
1.2.3.2 Dimensions test B
1.2.4 Electrical test procedures
1.2.4.1 Frequency and resonance resistance
1.2.4.2 Frequency and resonance resistance as a
           function of drive level
1.2.4.3 Frequency and resonance resistance as a
           function of temperature
1.2.4.4 Unwanted responses
1.2.4.5 Shunt capacitance
1.2.4.6 Load resonance frequency and resistance
1.2.4.7 Frequency pulling range
1.2.4.8 Insulation resistance
1.2.5 Mechanical test procedures
1.2.6 Mechanical and environmental test procedures
1.2.6.1 Robustness of terminations
1.2.6.2 Sealing tests
1.2.6.3 Solderability
1.2.6.4 Rapid change of temperature: severe shock by
           liquid immersion
1.2.6.5 Rapid change of temperature: thermal shock in
           air
1.2.6.6 Bump
1.2.6.7 Vibration
1.2.6.8 Shock
1.2.6.9 Acceleration, steady state
1.2.6.10 Climatic sequence
1.2.6.11 Damp heat, steady state
1.2.7 Endurance test procedure
1.2.7.1 Ageing
1.2.7.2 Shelf life
Section two. Procedures for the preparation of detail
              specifications
2.1 Basic information
2.1.1 The originator of the detail specification
2.1.2 The number of the detail specification
2.1.3 Description of the component and intended
           application
2.1 4 Outline drawing
2.1.5 Ratings
2.1.6 Characteristics
2.1.7 Related documents
2.1.8 Additional information (not for inspection
           purposes)
2.1.9 Ordering information
2.2 Inspection requirements
2.3 Certified test records
2.3.1 General information
2.3.2 Measurements information
2.3.3 Explanatory information
Appendices
A Preferred method for the measurement of
           resonance frequency fr and the resonance
           resistance Rr over the frequency range 1 MHz
           to 200 MHz
B Method for the measurement of the motional
           parameters of crystal units at frequencies
           below 1 MHz
C Terminal bend test and tool
D Example of a certified test record
E Code letters for frequency tolerances and
           operating temperature ranges
Tables
1 Examples of ageing test results for subgroup
           C5 in June to December 1982
2 Examples of shelf life test results for
           subgroup D5 in February to December 1982
3 Code letters for frequency tolerances and
           operating temperature ranges
Figures
1 Equivalent electric circuit of a
           piezoelectric vibrator near a resonance
2 Resonance, anti-resonance and load resonance
           frequencies
3 Schematic of measuring circuit
4 Circuit diagram of pi-network
5 Plot showing the phase change from the value
           at 25 ohms versus reference resistor values
           from 0 ohms to 100 ohms at 10 MHz, 50 MHz,
           100 MHz and 200 MHz
6 Typical pi-network
7 Details of pi-network assembly
8 Dimensions of contacting plates and earthed
           shield
9 Position of the reference resistor with
           respect to the pi-network contacting plates
10 Reference resistors
11 Power splitter
12 Phase/frequency response with a 25 ohm
           reference resistor
13 Schematic of transmission circuit
14 Terminal bend test tool

Essential test requirements and other general information relating to quartz crystal units. Intended to be used in conjunction with other relevant detail specifications in the BS 9000 series.

Committee
W/-
DevelopmentNote
REPLACES BS 2271:PART 1: 1964
DocumentType
Standard
Pages
38
PublisherName
British Standards Institution
Status
Withdrawn
Supersedes

Standards Relationship
CECC 68000 : 1989 AMD 2 1993 Similar to
CECC 68200 : 90 AMD 1 93 Similar to

BS 2011-2.1N:1985 Environmental testing. Tests Test N. Change of temperature
BS 2011-2.1Ca:1977 Environmental testing. Tests Test Ca. Damp heat, steady state
BS 5069-1:1980 Dimensions of piezoelectric devices Specification for standard outlines and pin connections for quartz crystal units
IEC 60444:1973 Basic method for the measurement of resonance frequency and equivalent series résistance of quartz crystal units by zero phase technique in a pi-network
BS 9000-2:1991 General requirements for a system for electronic components of assessed quality Specification for the national implementation of the CECC system
IEC 60302:1969 Standard definitions and methods of measurement for piezoelectric vibrators operating over the frequency range up to 30 MHz

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