BS CECC31300(1983) : 1983

Foreword
Preface
Section 1 - General
1.1 Scope
1.2 Related documents
1.3 Terminology
1.4 Marking
Section 2 - Ratings and characteristics
2.1 Preferred climatic categories
2.2 Rated capacitance (CR)
2.3 Tolerance on rated capacitance
2.4 Rated voltage (UR)
2.5 Temperature coefficient and capacitance drift
Section 3 - Quality assessment procedure
3.1 Primary stage of manufacture
3.2 Certified test records
3.3 Qualification approval
3.4 Quality conformance inspection
Section 4 - Test and measurement procedures
4.1 Standard atmospheric conditions
4.2 Visual examination and check of dimensions
4.3 Voltage proof
4.4 Capacitance
4.5 Tangent of the loss angle
4.6 Insulation resistance
4.7 Temperature coefficient and temperature cyclic
       drift of capacitance
4.8 Inductance
4.9 Short term stability
4.10 Test Q: Sealing
4.11 Tests of Groups 1a and C1a
4.12 Tests of Groups 1b and C1b
4.13 Climatic sequence
4.14 Test Ca: Damp heat steady state
4.15 Endurance
Appendix A: Test method for capacitor inductance

Applies to fixed d.c. capacitors, with a rated voltage not exceeding 3,000V, containing a dielectric of mica sheets and electrodes of either thin metal foils or thin layers of metal deposited on the dielectric. They are designed for use in equipment for telecommunication and in electronic devices. Capacitors for a reactive power exceeding 10,000 var are excluded, as are the following : mica capacitors, button style, mica power capacitors, mica pulse capacitors and mica chip capacitors.