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BS EN 160200-2:1998

Current

Current

The latest, up-to-date edition.

Harmonized system of quality assessment for electronic components. Sectional specification. Microwave modular electronic units of assessed quality Index of test methods

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

15-03-1998

Section one - General matters
1.1 Scope
1.2 Related documents
Section two - Test and measurement procedures
2.1 General
2.2 Special conditions for testing
2.3 Selection guide
2.4 Standard test methods
2.5 Special test methods
2.6 Alternative test methods

Specifies standard/reference test procedures for Electrical, Mechanical and Visual Inspection as prescribed in Part 1 of the Sectional Specification EN 160200 and Blank Detail Specification EN 160201 for Microwave Modular Electronic Units (MMEUs).

Committee
EPL/48
DevelopmentNote
Supersedes 93/205132 DC. (09/2005)
DocumentType
Standard
Pages
56
PublisherName
British Standards Institution
Status
Current
Supersedes

Standards Relationship
EN 160200-2 : 1997 Identical
NEN EN 160200-2 : 1998 Identical
I.S. EN 160200-2:1998 Identical
SN EN 160200-2 : 1996 Identical
DIN EN 160200-2:1998-05 Identical

EN 160100 : 1997 CAPABILITY APPROVAL OF MANUFACTURERS OF PRINTED BOARD ASSEMBLIES OFASSESSED QUALITY (SECTIONAL SPECIFICATION)
CECC 00010 : 1980 AMD 1 BASIC SPECIFICATION: TEST METHODS FOR PRINTED BOARDS
EN 160200-1 : 1997 MICROWAVE MODULAR ELECTRONIC UNITS OF ASSESSED QUALITY - PART 1: CAPABILITY APPROVAL PROCEDURE (SECTIONAL SPECIFICATION)
CECC 00803 : 1995 GUIDANCE DOCUMENT: VISUAL INSPECTION OF SOLDERED SURFACE MOUNTED ASSEMBLIES
CECC 45000 : 1975 GENERIC SPECIFICATION: SPACE-CHARGE CONTROLLED TUBES
EN 160000 : 93 AMD 1 95 GENERIC SPECIFICATION: MODULAR ELECTRONIC UNITS
EN 135000:1992 Generic Specification: Travelling wave amplifier tubes
EN 136000:1992 Generic Specification: Magnetrons
EN 160201 : 1997 MICROWAVE MODULAR ELECTRONIC UNITS OF ASSESSED QUALITY - CAPABILITY APPROVAL (BLANK DETAIL SPECIFICATION)
CECC 00009 : 1980 BASIC SPECIFICATION: BASIC TESTING PROCEDURES AND MEASURING METHODS FOR ELECTROMECHANICAL COMPONENTS
CECC 63000 : 84 AMD 5 GENERIC SPECIFICATION: FILM & HYBRID INTEGRATED CIRCUITS
EN 169000 : 92 AMD 1 98 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION: QUARTZ CRYSTAL CONTROLLED OSCILLATORS

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