Quartz crystal controlled oscillators of assessed quality Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guidelines

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

30-06-2011

Publisher

British Standards Institution

INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and general concepts
4 Measurement method
5 Measurement and the measurement environment
6 Measurement
7 Other points to be noted
8 Miscellaneous
Annex A (normative) - Calculation method for the
        amount of phase jitter
Bibliography
Annex ZA (normative) - Normative references to international
         publications with their corresponding European
         publications

Pertains to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate measurement of r.m.s. jitter.

This part of the IEC 60679 series applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate measurement of r.m.s. jitter.

In the measurement method, phase noise measurement equipment or a phase noise measurement system is used.

The measuring frequency range is from 10 MHz to1 000 MHz.

This standard applies to quartz crystal oscillators and SAW oscillators used in electronic devices and modules that have the multiplication or division functions based on these oscillators. The type of phase jitter applied to these oscillators is the r.m.s. jitter. In the following text, these oscillators and modules will be referred to as “oscillator(s)?? for simplicity.

Committee	W/-
DevelopmentNote	Supersedes DD IEC PAS 60679-6. (06/2011) Supersedes 08/30191168 DC. (07/2011)
DocumentType	Standard
Pages	26
PublisherName	British Standards Institution
Status	Current
Supersedes	DD IEC PAS 60679-6 : DRAFT MAY 2008 DD IEC/PAS 60679-6:2008 08/30191168 DC : DRAFT OCT 2008

Standards	Relationship
EN 60679-6:2011	Identical
IEC 60679-6:2011	Identical
IEC 61082-1:2006	Identical

IEC TS 61994-3:2011	Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 3: Piezoelectric and dielectric oscillators
IEC 60679-1:2017	Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification

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BS EN 60679-6:2011

Quartz crystal controlled oscillators of assessed quality Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guidelines

Table of Contents

Abstract

Scope

General Product Information

International Equivalents

Standards Referencing This Book

Category

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