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BS EN 60749-33:2004

Current

Current

The latest, up-to-date edition.

Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased autoclave

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

22-06-2004

FOREWORD
1 Scope and object
2 Normative references
3 Test apparatus
4 General requirements
5 Test conditions
6 Procedure
7 Failure criteria
8 Safety
9 Summary
Annex ZA (normative) Normative references to international
         publications with their corresponding European
         Publications

Evaluates the moisture resistance integrity of non-hermetically packaged solid-state devices using moisture condensing or moisture saturated steam environments.

The unbiased autoclave test is performed to evaluate the moisture resistance integrity of non-hermetically packaged solid-state devices using moisture condensing or moisture saturated steam environments. It is a highly accelerated test which employs conditions of pressure, humidity and temperature under condensing conditions to accelerate moisture penetration through the external protective material or along the interface between the external protective material and the metallic conductors passing through it.

Committee
EPL/47
DevelopmentNote
Supersedes 02/206197 DC. (10/2004)
DocumentType
Standard
Pages
10
PublisherName
British Standards Institution
Status
Current
Supersedes

Standards Relationship
EN 60749-33:2004 Identical
DIN EN 60749-33:2004-09 Identical
UNE-EN 60749-33:2005 Identical
NBN EN 60749-33 : 2005 Identical
I.S. EN 60749-33:2004 Identical
NF EN 60749-33 : 2005 Identical
IEC 60749-33:2004 Identical

EN 60749-24:2004 Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
IEC 60749-24:2004 Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST

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