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  • BS EN 61643-341:2001

    Withdrawn A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
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    LOW VOLTAGE SURGE PROTECTIVE DEVICES - SPECIFICATION FOR THYRISTOR SURGE SUPPRESSORS (TSS)

    Available format(s):  Hardcopy, PDF

    Withdrawn date:  10-07-2020

    Language(s):  English

    Published date:  01-01-2001

    Publisher:  British Standards Institution

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    General Product Information - (Show below) - (Hide below)

    Committee PEL/37/2
    Development Note Supersedes 01/203912 DC (05/2002)
    Document Type Standard
    Publisher British Standards Institution
    Status Withdrawn
    Superseded By
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60050-702:1992 International Electrotechnical Vocabulary (IEV) - Part 702: Oscillations, signals and related devices
    IEC 60721-3-9:1993 Classification of environmental conditions - Part 3: Classification of groups of environmental parameters and their severities - Section 9: Microclimates inside products
    IEC 60099-4:2014 Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems
    EN 60721-3-9:1993/A1:1995 CLASSIFICATION OF ENVIRONMENTAL CONDITIONS - PART 3: CLASSIFICATION OF GROUPS OF ENVIRONMENTAL PARAMETERS AND THEIR SEVERITIES - SECTION 9: MICROCLIMATES INSIDE PRODUCTS
    EN 60749 : 99 AMD 2 2001 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS
    EN 60099-4:2014 SURGE ARRESTERS - PART 4: METAL-OXIDE SURGE ARRESTERS WITHOUT GAPS FOR A.C. SYSTEMS (IEC 60099-4:2014)
    EN 61083-1 : 2001 INSTRUMENTS AND SOFTWARE USED FOR MEASUREMENT IN HIGH-VOLTAGE IMPULSE TESTS - PART 1: REQUIREMENTS FOR INSTRUMENTS
    IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
    IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
    IEC 60721-3-3:1994+AMD1:1995+AMD2:1996 CSV Classification of environmental conditions - Part 3-3: Classification of groups of environmental parameters and their severities - Stationary use at weatherprotected locations
    IEC 60747-6:2016 Semiconductor devices - Part 6: Discrete devices - Thyristors
    IEC 61083-1:2001 Instruments and software used for measurement in high-voltage impulse tests - Part 1: Requirements for instruments
    IEC 60747-2:2016 Semiconductor devices - Part 2: Discrete devices - Rectifier diodes
    EN 60721-3-3 : 95 AMD 2 97 CLASSIFICATION OF ENVIRONMENTAL CONDITIONS - CLASSIFICATION OF GROUPS OF ENVIRONMENTAL PARAMETERS AND THEIR SEVERITIES - STATIONARY USE AT WEATHER-PROTECTED LOCATIONS
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