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BS QC 750100:1986+A2:1996

Current

Current

The latest, up-to-date edition.

Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

31-01-2010

Procedures to be followed with discrete semiconductor devices (excluding optoelectronic devices), the possible group conditions for structurally similar devices, the requirements for quality conformance inspection and the various steps for screening. Also preferred values of voltages and currents, identification of terminals.

This sectional specification applies to discrete semiconductor devices, excluding opto-electronic devices.

Committee
EPL/47
DocumentType
Standard
Pages
22
PublisherName
British Standards Institution
Status
Current

Standards Relationship
IEC 60747-11:1985/AMD2:1996 Identical

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