SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 33: ACCELERATED MOISTURE RESISTANCE - UNBIASED AUTOCLAVE

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2012

Publisher

Comitato Elettrotecnico Italiano

FOREWORD
1 Scope and object
2 Normative references
3 Test apparatus
4 General requirements
5 Test conditions
6 Procedure
7 Failure criteria
8 Safety
9 Summary
Annex ZA (normative) - Normative
         references to international
         publications with their
         corresponding European
         Publications

Defines test is performed to evaluate the moisture resistance integrity of nonhermetic packaged solid-state devices using moisture condensing or moisture saturated steam environments.

Committee	CT 309
DevelopmentNote	Classificazione CEI 47-86. (03/2012)
DocumentType	Standard
Pages	14
PublisherName	Comitato Elettrotecnico Italiano
Status	Current

Standards	Relationship
EN 60749-33:2004	Identical
IEC 60749-33:2004	Identical

EN 60749-24:2004	Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
IEC 60749-24:2004	Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST

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CEI EN 60749-33 : 2012

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 33: ACCELERATED MOISTURE RESISTANCE - UNBIASED AUTOCLAVE

Table of Contents

Abstract

General Product Information

International Equivalents

Standards Referencing This Book

Category

Subcategory