DIN 50440:1998-11
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
TESTING OF MATERIALS FOR SEMICONDUCTOR TECHNOLOGY - MEASUREMENT OF CARRIER LIFETIME IN SILICON SINGLE CRYSTALS - RECOMBINATION CARRIER LIFETIME AT LOW INJECTION BY PHOTOCONDUCTIVITY METHOD
Hardcopy , PDF
01-01-2009
English
12-01-2013
The method specified serves to determine the recombination carrier lifetime of light-induced minority carriers in single-crystal silicon specimens for lifetimes regarding from 2 mus (depending on the equipment used) to a specimen-dependent maximum of 340 mus to 3900 mus. The approach is based on the decay of photoconductivity at low injection levels, using computer-aided techniques to maintain low-injection-level conditions and to carry out the lifetime measurement. This also involves the detection of any traps present in the silicon specimens. The lifetime measured in this way is virtually independent of the level of injection and is consequently a clearly defined parameter characterizing the concentration of recombination centres in the semi-conductor material.
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