EN 120000 : 1996

PART 1: Semiconductor optoelectronic and liquid devices
1 SCOPE
2 GENERAL
3 QUALITY ASSESSMENT PROCEDURES
4 TEST AND MEASUREMENT CONDITIONS
5 LASER MODULE RELIABILITY
PART 2: Visual inspection of LCD and rejection criteria
1 General
2 Visual inspection of viewing area
3 Seal inspection
4 Visual inspection of contact surface
5 Visual inspection for chipped material at the corners
   and edges of the glass plates
6 Visual inspection of the display
PART 3: Visual inspection requirements for opto-electronic
        semiconductor devices
1 General
2 Visual inspection requirements for dies
3 Visual inspection requirements for bonded die
4 Visual inspection requirements for packaged
   devices
PART 4: Capability approval
1 Introduction
2 Terminology
3 Procedure for granting the capability approval
4 Capability approval maintenance procedure
5 Procedure for reduction, extension or change of
   capability
6 Procedure in case of deficiency in maintenance of the
   capability approval
7 Capability manual
8 Capability test programme
9 Verification of capability (audit)
10 Quality assurance of products delivered under
   capability approval
11 Marking and ordering information
12 Capability abstract for publication purposes
13 Customer detail specifications
14 Standard catalogue items detail specifications
15 Detail specification register
16 Handling
17 Product safety
PART 5: Semiconductor laser diodes, laser diode modules
        and laser diode assemblies of assessed quality -
        Capability approval
1 General
2 Quality assessment procedures
3 Test and measurement procedures