EMC IC modelling - Part 3: Models of Integrated Circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)

Published date

02-06-2017

Publisher

European Committee for Standards - Electrical

FOREWORD
1 Scope
2 Normative references
3 Terms, definitions, abbreviations and conventions
4 Philosophy
5 ICEM-RE macro-model description
6 REML format
7 Extraction
8 Validation
Annex A (normative) - Preliminary definitions for XML
        representation
Annex B (informative) - Electromagnetic fields radiated
        by an elementary electric and magnetic dipole
Annex C (informative) - Example files
Annex D (normative) - REML valid keywords and usage
Annex E (informative) - ICEM-RE extraction methods
Annex F (informative) - ICEM-RE model validation examples
Annex G (informative) - ICEM-RE macro-model usage examples
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

IEC62433-3:2017 provides a method for deriving a macro-model to allow the simulation of the radiated emission levels of an Integrated Circuit (IC). This model is commonly called Integrated Circuit Emission Model - Radiated Emission, ICEM-RE. The model is intended to be used for modelling a complete IC, with or without its associated package, a functional block and an Intellectual Property (IP) block of both analogue and digital ICs (input/output pins, digital core and supply), when measured or simulated data cannot be directly imported into simulation tools.

Committee	CLC/SR 47A
DocumentType	Standard
PublisherName	European Committee for Standards - Electrical
Status	Current

Standards	Relationship
CEI EN 62433-3 : 1ED 2017	Identical
UNE-EN 62433-3:2017	Identical
SN EN 62433-3 : 2017	Identical
DIN EN 62433-3 : 2017	Identical
VDE 0847-33-3 : 2017	Identical
PN EN 62433-3 : 2017	Identical
IEC 62433-3:2017	Identical
NF EN 62433-3 : 2017	Identical
NEN EN IEC 62433-3 : 2017	Identical
I.S. EN 62433-3:2017	Identical
BS EN 62433-3:2017	Identical

IEC 61967-1:2002	Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
IEC TS 61967-3:2014	Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
IEC 62433-2:2017	EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
EN 61967-1:2002	Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
ISO 8879:1986	Information processing Text and office systems Standard Generalized Markup Language (SGML)
IEC TS 62433-1:2011	EMC IC modelling - Part 1: General modelling framework