QUALIFICATION AND RELIABILITY MONITORS

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-1999

Publisher

Government Electronics & Information Technology Association

1 Scope
2 Reference Documents
3 Qualification Tests
4 Monitoring Tests

Sets up the recommended minimum qualification and monitoring testing of plastic encapsulated microcircuits and discrete semiconductors suitable for potential use in many rugged, military, severe, or other environments.

Committee	SSTCG12
DevelopmentNote	Annex to GEIA SSB 1. (12/2005)
DocumentType	Standard
Pages	16
PublisherName	Government Electronics & Information Technology Association
Status	Current

GEIA SSB 1 : 2000	GUIDELINES FOR USING PLASTIC ENCAPSULATED MICROCIRCUITS AND SEMICONDUCTORS IN MILITARY, AEROSPACE AND OTHER RUGGED APPLICATIONS
DD IEC TS 62564-1 : DRAFT SEP 2011	PROCESS MANAGEMENT FOR AVIONICS - AEROSPACE QUALIFIED ELECTRONIC COMPONENTS (AQEC) - PART 1: INTEGRATED CIRCUITS AND DISCRETE SEMICONDUCTORS

MIL-STD-750 Revision F:2011

TEST METHODS FOR SEMICONDUCTOR DEVICES

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GEIA SSB 1.001 : 1999

QUALIFICATION AND RELIABILITY MONITORS

Table of Contents

Abstract

General Product Information

Standards Referenced By This Book

Standards Referencing This Book

Category

Subcategory