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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 34: POWER CYCLING

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Hardcopy , PDF

Language(s)

English

Published date

01-01-2010

Publisher

National Standards Authority of Ireland

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Only cited Standards give presumption of conformance to New Approach Directives/Regulations.

FOREWORD
1 Scope and object
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Test conditions
7 Precautions
8 Measurements
9 Failure criteria
10 Summary
Bibliography
Annex ZA (normative) - Normative references to international
publications with their corresponding European
publications

Provides a test method used to determine the resistance of a semiconductor device to thermal and mechanical stresses due to cycling the power dissipation of the internal semiconductor die and internal connectors.

DevelopmentNote	For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
DocumentType	Standard
Pages	16
PublisherName	National Standards Authority of Ireland
Status	Current

Standards	Relationship
BS EN 60749-34:2010	Identical
UNE-EN 60749-34:2011	Identical
NF EN 60749-34 : 2011	Identical
DIN EN 60749-34:2011-05	Identical
NBN EN 60749-34 : 2011	Identical
EN 60749-34:2010	Identical
IEC 60749-34:2010	Identical

EN 60749-23:2004/A1:2011	SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 23: HIGH TEMPERATURE OPERATING LIFE
IEC 60747-1:2006+AMD1:2010 CSV	Semiconductor devices - Part 1: General
IEC 60749-3:2017	Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
EN 60749-3:2017	Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
IEC 60747-6:2016	Semiconductor devices - Part 6: Discrete devices - Thyristors
IEC 60747-2:2016	Semiconductor devices - Part 2: Discrete devices - Rectifier diodes
IEC 60749-23:2004+AMD1:2011 CSV	Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

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I.S. EN 60749-34:2010

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 34: POWER CYCLING

Table of Contents

Abstract

General Product Information

International Equivalents

Standards Referencing This Book

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