IEC 60147-0:1966

Withdrawn

Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 0: General and terminology

Available format(s)

Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Withdrawn date

31-12-2021

Language(s)

English - French, Russian

Published date

01-01-1966

Publisher

International Electrotechnical Committee

Deals with essential ratings and characteristics of semiconductor devices and general principles of measuring methods. This publication is intended to be used in conjunction with IEC 147-1 and 147-2.

Committee	TC 47
DocumentType	Standard
Pages	57
PublisherName	International Electrotechnical Committee
Status	Withdrawn

Standards	Relationship
DIN 41854:1979-04	Similar to
DIN 41786:1976-06	Similar to
DIN 41853 : 1975	Similar to
NEN 10147-0 : 1986	Identical
NFC 96 112 : 81 AMD 1 81	Similar to
NFC 96 113 : 1980	Similar to
NFC 96 211 : 1979	Similar to

BS 5424-2:1987	Low-voltage controlgear Specification for semiconductor contactors (solid state contactors)
BS CECC 63000:1990	Harmonized system of quality assessment for electronic components. Generic specification: film and hybrid integrated circuits