Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits

Available format(s)

Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English - French, Russian

Published date

01-04-1992

Publisher

International Electrotechnical Committee

FOREWORD
Clause
1 Scope and object
2 Apparatus
3 Procedure for integrated circuits
  3.0 Introduction
  3.1 Test conditions
  3.2 Specified conditions
Figures

The purpose of these tests is to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification.

DevelopmentNote	Supersedes IEC 60186B. (07/2004) Also numbered as BS QC790101(1992) (08/2005) Stability Date: 2021. (11/2017)
DocumentType	Standard
Pages	71
PublisherName	International Electrotechnical Committee
Status	Current
Supersedes	IEC 60148B:1979

Standards	Relationship
GOST R IEC 748-11-1 : 2001	Identical

IEC 61747-1:1998+AMD1:2003 CSV

Liquid crystal and solid-state display devices - Part 1: Generic specification

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IEC 60748-11-1:1992

Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits

Table of Contents

Abstract

General Product Information

International Equivalents

Standards Referenced By This Book

Category

Subcategory