Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination

Available format(s)

Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English - French

Published date

01-03-1994

Publisher

International Electrotechnical Committee

The purpose of these examinations is to check the internal materials, construction and workmanship of film and hybrid integrated circuits (F and HFICs). These examinations will normally be used prior to tapping or encapsulation to detect and eliminate the F and HFICs with internal defects that could lead to device failure in normal application. Other acceptance criteria may be agreed upon with the purchaser or supplier, respectively.

DevelopmentNote	Also numbered as BS QC760001(1994) (08/2005) Stability Date: 2017. (10/2012)
DocumentType	Standard
Pages	55
PublisherName	International Electrotechnical Committee
Status	Current
Supersedes	IEC 60148B:1979

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