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ON
OVE EN IEC 60749-37:2024 01 01

OVE EN IEC 60749-37:2024 01 01

Current

Current

The latest, up-to-date edition.

Semiconductor devices – Mechanical and climatic test methods – Part 37: Board level drop test method using an accelerometer

Available format(s)

Hardcopy

Language(s)

English, German

Published date

01-01-2024

Publisher

Osterreichisches Normungsinstitut/Austrian Standards

Committee
TC 47
DocumentType
Test Method
Pages
54
ProductNote
This standard is also refers to IEC 60749-10, IEC 60749-20
PublisherName
Osterreichisches Normungsinstitut/Austrian Standards
Status
Current
Supersedes

Standards Relationship
IEC 60749-37:2022 Identical
EN IEC 60749-37:2022 Identical

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Hardcopy - English
Hardcopy - German
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