SEMI PV13 : 2014(R2021)
Current
The latest, up-to-date edition.
Test Method for Contactless Excess-Charge-Carrier Recombination Lifetime Measurement in Silicon Wafers, Ingots, and Bricks Using an Eddy-Current Sensor
Hardcopy
English
01-01-2021
The excess-charge-carrier (hereafter referred to as ‘excess carrier’) recombination lifetime is the central parameter to silicon solar cell device design, production, and process control.
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