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XP ISO/TS 16610-20 : 2006 XP

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

GEOMETRICAL PRODUCT SPECIFICATIONS (GPS) - FILTRATION - PART 20: LINEAR PROFILE FILTERS: BASIC CONCEPTS

Superseded date

01-07-2015

Published date

12-01-2013

Avant-propos
Introduction
1 Domaine d'application
2 Références normatives
3 Termes et définitions
4 Concepts de base
  4.1 Généralités
  4.2 Représentation discrète des données
  4.3 Représentation discrète du filtre de profil
      linéaire
  4.4 Représentation discrète de la fonction de
      pondération
5 Filtres de profil linéaires
  5.1 Équations de filtres
  5.2 Convolution discrète
  5.3 Fonction de transfert
  5.4 Bancs de filtres
Annexe A (informative) Vue d'ensemble des concepts
Annexe B (informative) Relations avec la matrice de
         filtrage
Annexe C (informative) Relations avec la matrice GPS
Bibliographie

La présente partie de l'ISO/TS 16610 expose les concepts de base des filtres de profil linéaires.

DevelopmentNote
Indice de classement: E05-040-20XP. XP ISO/TS 16610-20 December 2006. (12/2006)
DocumentType
Miscellaneous Product
PublisherName
Association Francaise de Normalisation
Status
Superseded
SupersededBy

Standards Relationship
ISO/TS 16610-20:2006 Identical

XP ISO/TS 16610-30 : 2009 XP GEOMETRICAL PRODUCT SPECIFICATIONS (GPS) - FILTRATION - PART 30: ROBUST PROFILE FILTERS: BASIC CONCEPTS
XP ISO/TS 16610-29 : 2006 XP GEOMETRICAL PRODUCT SPECIFICATIONS (GPS) - FILTRATION - PART 29: LINEAR PROFILE FILTERS: SPLINE WAVELETS
XP ISO/TS 16610-22 : 2006 XP GEOMETRICAL PRODUCT SPECIFICATIONS (GPS) - FILTRATION - PART 22: LINEAR PROFILE FILTERS: SPLINE FILTERS

NF ISO 99999 : 2006 PR INTERNATIONAL VOCABULARY OF BASIC AND GENERAL TERMS IN METROLOGY (VIM) - THIRD EDITION
NF EN ISO 11562 : 1998 GEOMETRICAL PRODUCT SPECIFICATIONS (GPS) - SURFACE TEXTURE: PROFILE METHOD - METROLOGICAL CHARACTERISTICS OF PHASE CORRECT FILTERS

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