BS EN 62433-2 - EMC IC MODELING - PART 2: MODELS OF INTEGRATED CIRCUITS FOR EMI BEHAVIOURAL SIMULATION - CONDUCTED EMISSIONS MODELING (ICEM-CE)

Available format(s)

Hardcopy , PDF

Language(s)

English

Publisher

British Standards Institution

FOREWORD
1 Scope
2 Normative references
3 Terms, definitions, abbreviations and conventions
4 Philosophy
5 ICEM-CE basic components
6 IC macro-models
7 CEML format
8 Requirements for parameter extraction
Annex A (normative) - Preliminary definitions for XML
        representation
Annex B (normative) - CEML Valid keywords and usage
Annex C (informative) - Example of ICEM-CE model
        in CEML format
Annex D (informative) - Conversions between parameter
        types
Annex E (informative) - Model parameter generation
Annex F (informative) - Decoupling capacitors
        optimization
Annex G (informative) - Conducted emission prediction
Annex H (informative) Conducted emission prediction
        at PCB level
Bibliography

BS EN 62433-2.

Committee	EPL/47
DocumentType	Draft
Pages	95
PublisherName	British Standards Institution
Status	NA

IEC 61967-4:2002+AMD1:2006 CSV	Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
ISO 8879:1986	Information processing Text and office systems Standard Generalized Markup Language (SGML)
CISPR 17:2011	Methods of measurement of the suppression characteristics of passive EMC filtering devices
IEC TS 62433-1:2011	EMC IC modelling - Part 1: General modelling framework