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JEDEC
ANSI/ESDA/JEDEC JS-002 : 2018

ANSI/ESDA/JEDEC JS-002 : 2018

Current

Current

The latest, up-to-date edition.

ANSI/ESDA/JEDEC JOINT STANDARD FOR ELECTROSTATIC DISCHARGE SENSITIVITY TESTING – CHARGED DEVICE MODEL (CDM) – DEVICE LEVEL

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2019

Publisher

JEDEC Solid State Technology Association

This standard establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD).

DocumentType
Standard
ISBN
1-58537-298-6
Pages
45
PublisherName
JEDEC Solid State Technology Association
Status
Current
Supersedes

DSCC V62/22612:2022 MICROCIRCUIT, BiCMOS, ULTRA-LOW-NOISE JESD204B DUAL-LOOP CLOCK JITTER CLEANER, MONOLITHIC SILICON

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