Standard Test Method for Determination of Surface Oxides on Copper Rod(for Electrical Purposes)

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

07-12-2021

Publisher

American Society for Testing and Materials

1.1This specification established a quantitative, laboratory conducted, electrolytic reduction method to determine the thickness of surface copper oxide films on copper rod produced to Specification B49 for further fabrication into electrical conductors.

1.2The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.3This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.

1.4This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

Committee	B 05
DocumentType	Test Method
Pages	5
PublisherName	American Society for Testing and Materials
Status	Current

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