We noticed you’re not on the correct regional site. Switch to our AMERICAS site for the best experience.
  • ASTM E 1250 : 1988 : R2000

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
    Add to Watchlist
    This Standard has been added successfully to your Watchlist.
    Please visit My Watchlist to see all standards that you are watching.
    Please log in or to add this standard to your Watchlist.
    We could not add this standard to your Watchlist.
    Please retry or contact support for assistance.
    You need to be logged in to add this standard to your Watchlist.
    Please log in now or create an account to add.
    You already added this Product in the Watchlist.

    Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices

    Available format(s):  Hardcopy, PDF

    Superseded date:  11-11-2014

    Language(s):  English

    Published date:  10-06-2000

    Publisher:  American Society for Testing and Materials

    Add to Watchlist

    Add To Cart

    Scope - (Show below) - (Hide below)

    1.1 Low energy components in the photon energy spectrum of Co-60 irradiators lead to absorbed dose enhancement effects in the radiation-hardness testing of silicon electronic devices. These low energy components may lead to errors in determining the absorbed dose in a specific device under test. This method covers procedures for the use of a specialized ionization chamber to determine a figure of merit for the relative importance of such effects. It also gives the design and instructions for assembling this chamber.

    1.2 This method is applicable to measurements in Co-60 radiation fields where the range of exposure rates is 7 X 10 -6 to 3 X 10 -2 C kg -1 s -1 (approximately 100 R/h to 100 R/s). For guidance in applying this method to radiation fields where the exposure rate is >100 R/s, see Appendix X1.

    Note 1-See Terminology E170 for definition of exposure and its units.

    1.3 The values stated in SI units are to be regarded as the standard. The values given in parentheses are for information only.

    1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

    General Product Information - (Show below) - (Hide below)

    Committee E 10
    Document Type Test Method
    Product Note Reconfirmed 2000
    Publisher American Society for Testing and Materials
    Status Superseded
    Superseded By

    Standards Referenced By This Book - (Show below) - (Hide below)

    ASTM F 1892 : 2012 : R2018 Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
    ASTM E 1249 : 2015 Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
    ASTM F 1190 : 2018 Standard Guide for Neutron Irradiation of Unbiased Electronic Components
    ASTM E 1854 : 2013 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
    • Access your standards online with a subscription


      • Simple online access to standards, technical information and regulations
      • Critical updates of standards and customisable alerts and notifications
      • Multi - user online standards collection: secure, flexibile and cost effective