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ASTM E 2446 : 2023 : REDLINE

Current

Current

The latest, up-to-date edition.

Standard Practice for Manufacturing Characterization of Computed Radiography Systems

Available format(s)

PDF

Language(s)

English

Published date

01-08-2023

1.1This practice covers the manufacturing characterization of computed radiography (CR) systems, consisting of a particular phosphor imaging plate (IP), scanner, software, scanner operational parameters, and an image display monitor, in combination with specified metal screens for industrial radiography.

1.2The practice defines system tests to be used to characterize the systems of different suppliers and make them comparable for users.

1.3This practice is intended for use by manufacturers of CR systems or certification agencies to provide quantitative results of CR system characteristics for nondestructive testing (NDT) user or purchaser consumption. Some of these tests require specialized test phantoms to ensure consistency of results among suppliers or manufacturers. These tests are not intended for users to complete, nor are they intended for long term stability tracking and lifetime measurements. However, they may be used for this purpose, if so desired. Practice E2445 describes tests which are intended for users to observe the CR performance and test the long term stability.

1.4The CR system performance is described by the basic spatial resolution, contrast, signal and noise parameters, and the equivalent penetrameter sensitivity (EPS). Some of these parameters are used to compare with DDA characterization and film characterization data (see Practice E2597 and Test Method E1815).

Note 1:For film system characterization, the signal is represented by the optical density of 2 (above fog and base) and the noise as granularity. The signal-to-noise ratio is normalized by the aperture (similar to the basic spatial resolution) of the system and is part of characterization. This normalization is given by the scanning circular aperture of 100 µm of the micro-photometer, which is defined in Test Method E1815 for film system characterization.

1.5The measurement of CR systems in this practice is restricted to a selected radiation quality to simplify the procedure. The properties of CR systems will change with radiation energy but not the ranking of CR system performance. Users of this practice may carry out the tests at different or additional radiation qualities (X-ray or gamma ray) if required.

1.6The values stated in SI are to be regarded as the standard.

1.7This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.

1.8This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

Committee
E 07
DocumentType
Redline
Pages
36
PublisherName
American Society for Testing and Materials
Status
Current
Supersedes

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