• There are no items in your cart
We noticed you’re not on the correct regional site. Switch to our AMERICAS site for the best experience.
Dismiss alert

ASTM E 3084 : 2017

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by
superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Standard Practice for Characterizing Particle Irradiations of Materials in Terms of Non-Ionizing Energy Loss (NIEL)

Available format(s)

Hardcopy , PDF

Superseded date

19-07-2022

Language(s)

English

Published date

09-03-2017

CONTAINED IN VOL. 12.02, 2017 Specifies a procedure for characterizing particle irradiations of materials in terms of non-ionizing energy loss (NIEL).

1.1This practice describes a procedure for characterizing particle irradiations of materials in terms of non-ionizing energy loss (NIEL). NIEL is used in published literature to characterize both charged and neutral particle irradiations.

1.2Although the methods described in this practice apply to any particles and target materials for which displacement cross sections are known (see Practice E521), this practice is intended for use in irradiations in which observed damage effects may be correlated with atomic displacements. This is true of some, but not all, radiation effects in electronic and photonic materials.

1.3Procedures analogous to this one are used for calculation of displacements per atom (dpa) in charged particle irradiations (see Practice E521) or neutron irradiations (see Practice E693).

1.4Guidance on calculation of dpa from NIEL is provided.

1.5Procedures related to this one are used for calculation of 1-MeV equivalent neutron fluence in electronic materials (see Practice E722), but in that practice the concept of damage efficiency, based on correlation of observed damage effects, is included.

1.6Guidance on conversion of NIEL in silicon to monoenergetic neutron fluence in silicon (see Practice E722), and vice versa, is provided.

1.7The application of this standard requires knowledge of the particle fluence and energy distribution of particles whose interaction leads to displacement damage.

1.8The correlation of radiation effects data is beyond the scope of this standard. A comprehensive review (1)2 of displacement damage effects in silicon and their correlation with NIEL provides appropriate guidance that is applicable to semiconductor materials and electronic devices.

Committee
E 10
DocumentType
Standard Practice
Pages
5
PublisherName
American Society for Testing and Materials
Status
Superseded
SupersededBy

ASTM E 722 : 2019 Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics

ASTM E 693 : 2017 : REDLINE Standard Practice for Characterizing Neutron Exposures in Iron and Low Alloy Steels in Terms of Displacements Per Atom (DPA)
ASTM E 521 : 2016 : REDLINE Standard Practice for Investigating the Effects of Neutron Radiation Damage Using Charged-Particle Irradiation
ASTM E 722 : 2014 : REDLINE Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
ASTM E 170 : 2017 : REDLINE Standard Terminology Relating to Radiation Measurements and Dosimetry

View more information
£62.61
Excluding VAT

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.