BS 6653:1985

Withdrawn

Method for expression of the properties of logic analyzers

Available format(s)

Hardcopy , PDF

Withdrawn date

20-04-2012

Language(s)

English

Published date

31-10-1985

Publisher

British Standards Institution

National foreword
Committees responsible
Method
1 Scope
2 Object
Section one. Definitions
3 General terms
4 Terms related to triggering
5 Terms related to acquisition
6 Terms related to data representation
Section two. General test requirements
7 General
8 Statement of limits of error
9 Performance to be verified and checked
10 Combinations of mainframe with plug-ins
11 Conditions for test location
12 Type tests
13 General conditions for test purposes
14 Standard values and ranges of influence quantities
15 Preparation for tests
16 Particular conditions
17 Reference conditions
Section three. Test procedures
18 Sensitivity
19 Maximum clock rate
20 Set-up time
21 Hold time
22 Glitch recognitions
Table
1 Reference conditions
Figures
1 Threshold error and sensitivity
2 Set-up and hold time
3 Glitch latch
Index of terms

Gives uniform methods of expression of the properties of logic analyzers and defines special terminology and catalogue data related to such apparatus. In addition specifies conditions and methods of test to enable verification of compliance with properties claimed or specified by the manufacturer.

Committee	PEL/85
DevelopmentNote	Also numbered as IEC 60776 Supersedes 80/23950 DC Inactive for the new design. (09/2005)
DocumentType	Standard
Pages	14
PublisherName	British Standards Institution
Status	Withdrawn

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