BS CECC 90000:1985

Superseded

Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits

Available format(s)

Hardcopy , PDF

Superseded date

29-03-1991

Language(s)

English

Published date

29-11-1985

Publisher

British Standards Institution

General details, quality assessment procedures, test and measurement procedures and details of screening requirements.

Committee	EPL/47
DevelopmentNote	Supersedes 81/31418 DC, 86/23012 DC, 86/23480 DC, 87/23549 DC & 90/33497 DC Inactive for the new design. Superseded by BS CECC90000(1991) but remains current for existing approvals. Supersedes BS 9400(1970). (05/2005)
DocumentType	Standard
Pages	200
PublisherName	British Standards Institution
Status	Superseded
SupersededBy	BS CECC 90000:1991
Supersedes	BS 9400:1970 BS CECC90000(1982) : LATEST

Standards	Relationship
CECC 90000 : 90 AMD 1	Identical

EN 190102:1994	Family Specification: TTL-Schottky digital integrated circuits - Series 54S, 64S, 74S, 84S
BS EN 190102:1994	Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL-SCHOTTKY circuits, series 54S, 64S, 74S, 84S

BS 5555:1993	Specification for SI units and recommendations for the use of their multiples and of certain other units
IEC 60147-1:1972	Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 1: Essential ratings and characteristics
IEC 60134:1961	Rating systems for electronic tubes and valves and analogous semiconductor devices
BS E9007:1975	Specification for harmonized system of quality assessment for electronic components: Basic specification: Sampling plans and procedures for inspection by attributes
IEC 60027-1:1992	Letters symbols to be used in electrical technology - Part 1: General
BS 4727(1971) : LATEST
BS 3934:1965	Specification for dimensions of semiconductor devices and integrated electronic circuits
BS 2011(1967) : LATEST
IEC 60191-3:1999	Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits
BS 6001(1972) : AMD 5054	SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS INDEXED BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT - BY - LOT INSPECTION
IEC 60147-2:1963	Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods

£356.00

Excluding VAT

Product format

I agree to the DRM document license rules apply against the PDF selection made.

Please confirm that you agree to the document license rules for this document.

I agree to the document license rules .

Please confirm that you agree to the document license rules for this document.

Access your standards online with a subscription

Features