Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

15-08-1987

Publisher

British Standards Institution

Gives ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BS CECC 90100 in any detail specification for these devices.

Committee	EPL/47
DevelopmentNote	Supersedes 90/20593 DC (01/2006)
DocumentType	Standard
Pages	20
PublisherName	British Standards Institution
Status	Current

Standards	Relationship
CECC 90112 : 86 AMD 1 93	Identical

BS CECC 90100:1983	Harmonized system of quality assessment for electronic components: sectional specification: digital monolithic integrated circuits
BS CECC 90000:1991	Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
BS 9000-2(1996) : 1996	GENERAL REQUIREMENTS FOR A SYSTEM FOR ELECTRONIC COMPONENTS OF ASSESSED QUALITY - SPECIFICATION FOR THE NATIONAL IMPLEMENTATION OF THE CECC SYSTEM