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BS IEC 60748-4-3:2006

Current

Current

The latest, up-to-date edition.

Semiconductor devices. Integrated circuits Interface integrated circuits. Dynamic criteria for analogue-digital converters (ADC)

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

28-02-2007

INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Characteristics
5 Measuring methods
  5.1 Dynamic testing with sinusoidal signals
  5.2 Dynamic tests with wideband signals
  5.3 Linearity error of a linear
      ADC (E[L]) (E[L(adj)]) (E[T])
  5.4 Differential linearity error (E[D])
Annex A (informative) Mathematical derivations
Annex B (informative) Wideband signal generation
        and analysis
Bibliography

Describes a set of measuring methods and requirements for testing ADCs under dynamic conditions, together with associated terminology and characteristics.

Specifies a set of measuring methods and requirements for testing ADCs under dynamic conditions, together with associated terminology and characteristics

Committee
EPL/47
DocumentType
Standard
Pages
38
PublisherName
British Standards Institution
Status
Current

Standards Relationship
IEC 60748-4-3:2006 Identical

IEC 60268-10:1991 Sound system equipment - Part 10: Peak programme level meters
IEC 60748-4:1997 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits

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£232.00
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