• There are no items in your cart
We noticed you’re not on the correct regional site. Switch to our AMERICAS site for the best experience.
Dismiss alert

CEI EN 60444-8 : 2004

Current

Current

The latest, up-to-date edition.

MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 8: TEST FIXTURE FOR SURFACE MOUNTED QUARTZ CRYSTAL UNITS

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2004

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Specifications
4 Leadless surface mounted quartz crystal units
5 Specifications of measurement method, test fixture
6 Calibration
Bibliography
Annex ZA (normative) - Normative references
         to international publications with their
         corresponding European publications

Defines test fixtures suitable for leadless surface mounted quartz crystal units in enclosures as defined in IEC 61837 (all parts).

Committee
CT 309
DevelopmentNote
Classificazione CEI 309-1011. (08/2015) 1ED 2004 Edition is valid until 19-01-2020. (01/2018)
DocumentType
Standard
Pages
18
PublisherName
Comitato Elettrotecnico Italiano
Status
Current

Standards Relationship
EN 60444-8:2017 Identical
IEC 60444-8:2016 Identical

IEC 60444-5:1995 Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
EN 60444-5:1997 Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction

View more information
£42.38
Excluding VAT

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.