CEI EN 60749-35 : 2012
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 35: ACOUSTIC MICROSCOPY FOR PLASTIC ENCAPSULATED ELECTRONIC COMPONENTS
Hardcopy , PDF
English
01-01-2012
FOREWORD
1 Scope
2 Terms and definitions
3 Test apparatus
4 Procedure
Annex A (informative) - Acoustic
microscopy check sheet
Annex B (informative) - Potential
image pitfalls
Annex C (informative) - Some
limitations of acoustic
microscopy
Annex D (informative) - Reference
checklist for presenting
applicable scanned data
Bibliography
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