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CEI ES 59001 : 2000

Current

Current

The latest, up-to-date edition.

APPROVAL SCHEME FOR AUTOMOTIVE ORIENTED APPLICATIONS WITHIN THE ELECTRONIC COMPONENTS INDUSTRY - SEMICONDUCTOR STRESS TEST QUALIFICATION

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2000

Introduction
1 General
2 Requirements
3 Qualification
Annex A (normative) - Definition of a qualification technology
        family
Annex B (normative) - Guidelines for use of generic date for
        custom device qualification
Annex C (informative) - Application specific requirements:
        Recommendations on vehicles electrical and electronic
        equipment environment for electronic components
        based on silicon

Specifies the minimum stress test driven qualification requirements and references test conditions for qualification of semiconductor devices (SCs) for the automotive environment.

Committee
CT 309
DevelopmentNote
Classificazione CEI 47-11 (01/2003)
DocumentType
Standard
Pages
34
PublisherName
Comitato Elettrotecnico Italiano
Status
Current

Standards Relationship
ES 59001 : 1998 Identical

MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS

View more information
£59.33
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