DIN 50431:1988-05
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
TESTING OF SEMICONDUCTOR MATERIALS; MEASUREMENT OF THE RESISTIVITY OF SILICON OR GERMANIUM SINGLE CRYSTALS BY MEANS OF THE FOUR PROBE DIRECT CURRENT METHOD WITH CO-LINEAR ARRAY
Hardcopy , PDF
01-01-2009
English
12-01-2013
The four probe/direct current method as specified is used for measuring the resistivity of silicon or germanium. It differs from the test method specified in DIN 50430 in that the values obtained from measurements here related to a significantly similar portion of the overall volume, so that this method is particularly suitable for determining localized fluctuations in resistivity; it is the preferred method for measurements at the ends and around the surface of rod-shaped single crystals and on single crystals in the form of slices with approximately parallel faces.
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