EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)

Published date

21-10-2016

Publisher

European Committee for Standards - Electrical

FOREWORD
1 Scope
2 Normative references
3 Terms, definitions, abbreviations and conventions
4 Philosophy
5 ICIM-CI model description
6 CIML format
7 Extraction
8 Validation of ICIM-CI hypotheses
9 Model usage
Annex A (normative) - Preliminary definitions for
        XML representation
Annex B (informative) - ICIM-CI example with
        disturbance load
Annex C (informative) - Conversions between
        parameter types
Annex D (informative) - Example of ICIM-CI
        macro-model in CIML format
Annex E (normative) - CIML Valid keywords and usage
Annex F (informative) - PDN impedance measurement
        methods using vector network analyzer
Annex G (informative) - RFIP measurement method
        description
Annex H (informative) - Immunity simulation with
        ICIM model based on pass/fail test
Annex I (informative) - Immunity simulation with
        ICIM model based on non pass/fail test
Bibliography
Annex ZA (normative) - Normative references
        to international publications with their
        corresponding European publications

IEC 62433-4:2016 specifies a flow for deriving a macro-model to allow the simulation of the conducted immunity levels of an integrated circuit (IC). This model is commonly called Integrated Circuit Immunity Model - Conducted Immunity, ICIM-CI. It is intended to be used for predicting the levels of immunity to conducted RF disturbances applied on IC pins. In order to evaluate the immunity threshold of an electronic device, this macro-model will be inserted in an electrical circuit simulation tool. This macro-model can be used to model both analogue and digital ICs (input/output, digital core and supply). This macro-model does not take into account the non-linear effects of the IC. The added value of ICIM-CI is that it could also be used for immunity prediction at board and system level through simulations. This part of IEC 62433 has two main parts:- the electrical description of ICIM-CI macro-model elements;- a universal data exchange format called CIML based on XML. This format allows ICIM-CI to be encoded in a more useable and generic form for immunity simulation.

Committee	CLC/SR 47A
DocumentType	Standard
PublisherName	European Committee for Standards - Electrical
Status	Current

Standards	Relationship
UNE-EN 62433-4:2016	Identical
NEN EN IEC 62433-4 : 2016	Identical
PN EN 62433-4 : 2017	Identical
VDE 0847-33-4 : 2017	Identical
SN EN 62433-4:2016	Identical
BS EN 62433-4:2016	Identical
NF EN 62433-4 : 2016	Identical
CEI EN 62433-4 : 1ED 2017	Identical
IEC 62433-4:2016	Identical
DIN EN 62433-4 : 2017	Identical

EN 62132-4:2006	Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
IEC 62132-4:2006	Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
EN 62132-1:2016	Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
IEC 62433-2:2017	EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
EN 62433-2:2017	EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
IEC 62132-1:2015	Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
ISO 8879:1986	Information processing Text and office systems Standard Generalized Markup Language (SGML)
ISO/IEC 646:1991	Information technology ISO 7-bit coded character set for information interchange
CISPR 17:2011	Methods of measurement of the suppression characteristics of passive EMC filtering devices
EN 55017 : 2011	METHODS OF MEASUREMENT OF THE SUPPRESSION CHARACTERISTICS OF PASSIVE EMC FILTERING DEVICES (CISPR 17:2011)