Name: EN ISO 26423:2016
Brand: CEN

Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of coating thickness by crater-grinding method (ISO 26423:2009)

Published date

20-04-2016

Publisher

Comite Europeen de Normalisation

European foreword
Foreword
1 Scope
2 Normative references
3 Symbols
4 Principle
5 Sampling
6 Test procedure
7 Microscopic examination and measurement
8 Calculations
9 Uncertainty and sources of error
10 Test report
Annex A (informative) - Errors associated with using
different formulae for calculating film thickness
Annex B (informative) - Estimating measurement
uncertainty and errors
Bibliography

ISO 26423:2009 specifies a method for the determination of the thickness of ceramic coatings by a crater grinding method, which includes the grinding of a spherical cavity and subsequent microscopic examination of the crater. Because of the uncertainty introduced into the measurement of crater dimensions, the test is not suitable for use where the surface roughness of the coating and/or substrate exceeds 20 % of the coating thickness.

Committee	CEN/TC 184
DevelopmentNote	Supersedes EN 1071-2. (05/2016)
DocumentType	Standard
PublisherName	Comite Europeen de Normalisation
Status	Current
Supersedes	EN 1071-2 : 2002

Standards	Relationship
I.S. EN ISO 26423:2016	Identical
PN EN ISO 26423 : 2016	Identical
DIN EN ISO 26423 E : 2016	Identical
DIN EN ISO 26423:2015-11 (Draft)	Identical
NBN EN ISO 26423 : 2016	Identical
NF EN ISO 26423 : 2016	Identical
BS EN ISO 26423:2016	Identical
ISO 26423:2009	Identical
NS EN ISO 26423 : 2016	Identical
NEN EN ISO 26423 : 2016	Identical
UNE-EN ISO 26423:2016	Identical
UNI EN ISO 26423:2016	Identical
SN EN ISO 26423:2016	Identical
DIN EN ISO 26423:2016-11	Identical

ISO/IEC 17025:2005	General requirements for the competence of testing and calibration laboratories
ISO 3290-1:2014	Rolling bearings Balls Part 1: Steel balls
ISO 18452:2005	Fine ceramics (advanced ceramics, advanced technical ceramics) Determination of thickness of ceramic films by contact-probe profilometer