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MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 8: TEST FIXTURE FOR SURFACE MOUNTED QUARTZ CRYSTAL UNITS

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Hardcopy , PDF

Language(s)

English

Published date

01-01-2017

Publisher

National Standards Authority of Ireland

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For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.

National Foreword
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Specifications
4 Leadless surface mounted quartz crystal units
5 Specifications of measurement method, test fixture
6 Calibration
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications

Defines test fixtures suitable for leadless surface mounted quartz crystal units in enclosures as defined in IEC 61837 (all parts).

DevelopmentNote	For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
DocumentType	Standard
Pages	30
PublisherName	National Standards Authority of Ireland
Status	Current
Supersedes	I.S. EN 60444-8:2003

Standards	Relationship
NBN EN 60444-8 : 2003	Identical
SN EN 60444-8 : 2017	Identical
DIN EN 60444-8:2004-03	Identical
NF EN 60444-8 : 2017	Identical
EN 60444-8:2017	Identical
BS EN 60444-8:2017	Identical

IEC 61837-1:2012	Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
IEC 60444-5:1995	Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
IEC 61837-2:2011+AMD1:2014 CSV	Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part2: Ceramic enclosures
IEC 60444-2:1980	Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
IEC 60444-6:2013	Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
IEC 61837-3:2015	Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures
IEC 60444-9:2007	Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
IEC 60444-7:2004	Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
IEC 60122-1:2002	Quartz crystal units of assessed quality - Part 1: Generic specification
EN 60444-5:1997	Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction

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I.S. EN 60444-8:2017

MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 8: TEST FIXTURE FOR SURFACE MOUNTED QUARTZ CRYSTAL UNITS

Table of Contents

Abstract

General Product Information

International Equivalents

Standards Referencing This Book

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