I.S. EN 60749-18:2003
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 18: IONIZING RADIATION (TOTAL DOSE)
Hardcopy , PDF
18-06-2019
English
01-01-2003
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
FOREWORD
1 Scope
2 Terms and definitions
3 Test apparatus
3.1 Radiation source
3.2 Dosimetry system
3.3 Electrical test instruments
3.4 Test circuit board(s)
3.5 Cabling
3.6 Interconnect or switching system
3.7 Environmental chamber
4 Procedure
4.1 Sample selection and handling
4.2 Burn-in
4.3 Dosimetry measurements
4.4 Lead/aluminium (Pb/Al) container
4.5 Radiation level(s)
4.6 Radiation dose rate
4.6.1 Condition A
4.6.2 Condition B
4.6.3 Condition C
4.7 Temperature requirements
4.8 Electrical performance measurements
4.9 Test conditions
4.9.1 In-flux testing
4.9.2 Remote testing
4.9.3 Bias and loading conditions
4.10 Post-irradiation procedure
4.11 Extended room temperature anneal test
4.11.1 Need to perform an extended room
temperature anneal test
4.11.2 Extended room temperature anneal test
procedure
4.12 MOS accelerated annealing test
4.12.1 Need to perform accelerated annealing
test
4.12.2 Accelerated annealing test procedure
4.13 Test report
5 Summary
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