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I.S. EN 60749-28:2017

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by
superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 28: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - CHARGED DEVICE MODEL (CDM) - DEVICE LEVEL

Available format(s)

Hardcopy , PDF

Superseded date

06-06-2022

Language(s)

English

Published date

01-01-2017

Preview

For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.

National Foreword
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Required equipment
5 Periodic tester qualification, waveform records, and
  waveform verification requirements
6 CDM ESD testing requirements and procedures
7 CDM classification criteria
Annex A (normative) - Verification module (metal disc)
        specifications and cleaning guidelines for verification
        modules and testers
Annex B (normative) - Capacitance measurement of verification
        modules (metal discs) sitting on a tester field plate
        dielectric
Annex C (informative) - CDM test hardware and metrology
        improvements
Annex D (informative) - CDM tester electrical schematic
Annex E (informative) - Sample oscilloscope setup and waveform
Annex F (informative) - Field-induced CDM tester discharge
        procedures
Annex G (informative) - Waveform verification procedures
Annex H (informative) - Determining the appropriate charge delay
        for full charging of a large module or device
Annex I (informative) - Electrostatic discharge (ESD) sensitivity
        testing direct contact charged device model (DC-CDM)
Bibliography

Defines the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD).

DevelopmentNote
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (07/2017)
DocumentType
Standard
Pages
56
PublisherName
National Standards Authority of Ireland
Status
Superseded
SupersededBy

Standards Relationship
EN 60749-28:2017 Identical

IEC 60749-26:2013 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

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£58.57
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