Guide to dynamic measurements of piezoelectric ceramics with high electromechanical coupling

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English - French, Russian

Published date

01-01-1976

Publisher

International Electrotechnical Committee

Reviews admittance characteristics and equivalent circuits of ceramic resonators vibrating in simple modes. Contains methods for determining resonator parameters and material constants.

Committee	TC 49
DevelopmentNote	Stability Date: 2017. (09/2017)
DocumentType	Standard
Pages	35
PublisherName	International Electrotechnical Committee
Status	Current

Standards	Relationship
DIN IEC 60483:1988-04	Identical

BS EN 50324-1:2002	Piezoelectric properties of ceramic materials and components Terms and definitions
IEC 62047-30:2017	Semiconductor devices - Micro-electromechanical devices - Part 30: Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
EN 50324-1:2002	Piezoelectric properties of ceramic materials and components - Part 1: Terms and definitions
16/30338636 DC : 0	BS IEC 62047-30 - SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 30: MEASUREMENT METHODS OF ELECTRO-MECHANICAL CONVERSION CHARACTERISTICS OF MEMS PIEZOELECTRIC THIN FILM
17/30309777 DC : 0	BS ISO 19622 - FINE CERAMICS (ADVANCED CERAMICS, ADVANCED TECHNICAL CERAMICS) - TEST METHOD FOR PIEZOELECTRIC CONSTANT D[33] OF PIEZOELECTRIC CERAMICS BY DIRECT QUASI-STATIC METHOD
BS IEC 62047-30:2017	Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
NF EN 50324-1 : 2002	PIEZOELECTRIC PROPERTIES OF CERAMIC MATERIALS AND COMPONENTS - PART 1: TERMS AND DEFINITIONS
ISO 19622:2018	Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for piezoelectric constant d33 of piezoelectric ceramics by direct quasi-static method
ISO 17859:2015	Fine ceramics (advanced ceramics, advanced technical ceramics) Measurement method of piezoelectric strain at high electric field
BS ISO 17859:2015	Fine ceramics (advanced ceramics, advanced technical ceramics). Measurement method of piezoelectric strain at high electric field
14/30265605 DC : 0	BS ISO 17859 - FINE CERAMICS (ADVANCED CERAMICS, ADVANCED TECHNICAL CERAMICS) - MEASUREMENT METHOD OF PIEZOELECTRIC STRAIN AT HIGH ELECTRIC FIELD
I.S. EN 50324-1:2002	PIEZOELECTRIC PROPERTIES OF CERAMIC MATERIALS AND COMPONENTS - PART 1: TERMS AND DEFINITIONS
NF EN 60917-1 : 99 AMD 1 2001	MODULAR ORDER FOR THE DEVELOPMENT OF MECHANICAL STRUCTURES FOR ELECTRONIC EQUIPMENT PRACTICES - PART 1: GENERIC STANDARD