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IEC 60747-14-2:2000

Current

Current

The latest, up-to-date edition.

Semiconductor devices - Part 14-2: Semiconductor sensors - Hall elements

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English

Published date

09-11-2000

FOREWORD
INTRODUCTION
1 General
      1.1 Scope
      1.2 Normative references
      1.3 Definitions
      1.4 Symbols
2 Essential ratings and characteristics
      2.1 General
      2.2 Ratings (limiting values)
      2.3 Characteristics
3 Measuring methods
      3.1 General
      3.2 Output Hall voltage (VH)
      3.3 Offset voltage (Vo)
      3.4 Input resistance (Rin)
      3.5 Output resistance (Rout)
      3.6 Temperature coefficient of output Hall voltage
             (aVH)
      3.7 Temperature coefficient of input resistance
             (aRin)

Provides standards for packaged semiconductor Hall elements which utilize the Hall effect.

Committee
TC 47/SC 47E
DevelopmentNote
Stability Date: 2017. (09/2017)
DocumentType
Standard
Pages
14
PublisherName
International Electrotechnical Committee
Status
Current

Standards Relationship
BS IEC 60747-14.2 : 2000 Identical
NEN IEC 60747-14-2 : 2001 Identical
BS IEC 60747-14-2:2000 Identical

IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General

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