IEEE 1505.1-2019
Current
Current
The latest, up-to-date edition.
IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
20-08-2019
The scope of this standard is the definition of a physical pin map utilizing the IEEE 1505(TM) receiver fixture interface (RFI).
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