Name: IEEE 1804-2017
Brand: IEEE
Price: 51.39 GBP

IEEE Standard for Fault Accounting and Coverage Reporting(FACR) for Digital Modules

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

31-01-2018

Publisher

Institute of Electrical & Electronics Engineers

1. Overview
2. Definitions, acronyms, and abbreviations
3. Fault classification and test coverage reporting
4. Fault modeling
5. Fault accounting methods and rules
6. Summary
Annex A (informative) - Bibliography

Specifies aspects of the stuck-at fault model as they are relevant to the generation of test patterns for digital circuits.

Committee	Test Technology
DocumentType	Standard
ISBN	978-1-5044-4317-3
Pages	29
PublisherName	Institute of Electrical & Electronics Engineers
Status	Current

IEEE 1364-2005	IEEE Standard for Verilog Hardware Description Language
IEEE 1500:2007	TESTABILITY METHOD FOR EMBEDDED CORE-BASED INTEGRATED CIRCUITS

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IEEE 1804-2017

IEEE Standard for Fault Accounting and Coverage Reporting(FACR) for Digital Modules

Table of Contents

Abstract

General Product Information

Standards Referencing This Book

Category

Subcategory