IEEE/IEC 63003-2015
Current
Current
The latest, up-to-date edition.
IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
30-12-2015
| Committee |
SCC20 - Test and Diagnosis for Electronic Sys
|
| DocumentType |
Standard
|
| Pages |
175
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Current
|
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