Connectors for electronic equipment - Tests and measurements Part 11-11: Climatic tests - Test 11k: Low air pressure

Available format(s)

Hardcopy , PDF

Language(s)

English, Japanese

Published date

20-03-2005

Publisher

Japanese Standards Association

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This section of JIS C 5402-11 is to define a standard test method to assess the ability of components to be stored and/or to function in a specified manner under specified conditions of low air pressure, for example high altitude.

DocumentType	Test Method
Pages	7
PublisherName	Japanese Standards Association
Status	Current

Standards	Relationship
IEC 60512-11-11:2002	Identical

Reaffirmed 2014 2005(R2014) [20/10/2014]2005(R2009) [01/10/2009]2005 [20/03/2005]

JIS C 60068-2-13:1989	This Japanese Industrial Standard specifies the low pressure tests performed at room temperature. Part 2: Tests, Test M: Low air pressure
JIS C 5402-1-1:2005	Connectors for electronic equipment --Tests and measurements-- Part 1-1: General examination -- Test 1a: Visual examination

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JIS C 5402-11-11:2005

Connectors for electronic equipment - Tests and measurements Part 11-11: Climatic tests - Test 11k: Low air pressure

Table of Contents

Abstract

General Product Information

International Equivalents

History

Standards Referenced By This Book

Category

Subcategory