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NEN EN IEC 60444-2 : 1997

Current

Current

The latest, up-to-date edition.

MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK - PHASE OFFSET METHOD FOR MEASUREMENT OF MOTIONAL CAPACITANCE OF QUARTZ CRYSTAL UNITS

Published date

12-01-2013

Defines method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.

DevelopmentNote
Supersedes NEN 10444-2 (07/2002)
DocumentType
Standard
PublisherName
Netherlands Standards
Status
Current
Supersedes

Standards Relationship
EN 60444-2:1997 Identical
IEC 60444-2:1980 Identical

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