SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 17: NEUTRON IRRADIATION

Published date

12-01-2013

Publisher

Association Francaise de Normalisation

Foreword
1 Scope and object
2 Test apparatus
3 Procedure
4 Summary

Performed to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

DevelopmentNote	PR NF EN 60749-17 February 2002. Indice de Classement: C96-022-17. (01/2002)
DocumentType	Standard
PublisherName	Association Francaise de Normalisation
Status	Current

Standards	Relationship
DIN EN 60749-17:2003-09	Identical
IEC 60749-17:2003	Identical
BS EN 60749-17:2003	Identical
I.S. EN 60749-17:2003	Identical
UNE-EN 60749-17:2003	Identical
EN 60749-17:2003	Identical

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NF EN 60749-17 : 2003

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 17: NEUTRON IRRADIATION

Table of Contents

Abstract

General Product Information

International Equivalents

Category

Subcategory