SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 36: ACCELERATION STEADY STATE

Published date

12-01-2013

Publisher

Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications

Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices.

DevelopmentNote	Indice de classement: C96-022-36. (09/2003) Supersedes NF EN 60749. (06/2007)
DocumentType	Standard
PublisherName	Association Francaise de Normalisation
Status	Current

Standards	Relationship
DIN EN 60749-36:2003-12	Identical
EN 60749-36:2003	Identical
IEC 60749-36:2003	Identical
I.S. EN 60749-36:2003	Identical
UNE-EN 60749-36:2004	Identical
BS EN 60749-36:2003	Identical

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NF EN 60749-36 : 2003

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 36: ACCELERATION STEADY STATE

Table of Contents

Abstract

General Product Information

International Equivalents

Category

Subcategory